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分類 国際会議
著者名 (author) D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
表題 (title) MTTF Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability
表題 (英文)
書籍・会議録表題 (booktitle) IEEE Workshop on Silicon Errors in Logic - System Effects
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) March
出版年 (year) 2011
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-243]  D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Mttf Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability,'' In IEEE Workshop on Silicon Errors in Logic - System Effects, March 2011.

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    T. Onoye},
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    title = {MTTF Measurement Under Alpha Particle Radiation in a Coarse-Grained
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    title_e = {},
    booktitle = {IEEE Workshop on Silicon Errors in Logic - System Effects},
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    month = {March},
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