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分類 国際会議
著者名 (author) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Ryo Harada, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye
表題 (title) Neutron Induced Single Event Multiple Transients With Voltage Scaling and Body Biasing
表題 (英文)
書籍・会議録表題 (booktitle) Proc. International Reliability Physics Symposium (IRPS)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) April
出版年 (year) 2011
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) This paper presents measurement results of neutron induced SEMT (single event multiple transients). We devise an SEMT measurement circuit and evaluate the dependency of SEMT on supply and body voltages using test chips fabricated
in a 65nm CMOS process. Measurement results show that transients can arise simultaneously at adjacent six inverters sharing the same well, and SEMT ratio to all the single event transients reaches 40% at 0.7V with reverse body biasing. We also investigate the correlation between the spatial spreading of
SEMT and the distance between sensitive nodes in layout. Furthermore, referring to the occurrence rates of single event single transient (SEST) and single event single upset (SESU), we validate the measured results.
論文電子ファイル Not available.


[1-231]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing,'' In Proc. International Reliability Physics Symposium (IRPS), April 2011.

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    title = {Neutron Induced Single Event Multiple Transients With Voltage
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    booktitle = {Proc. International Reliability Physics Symposium (IRPS)},
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