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分類 国際会議
著者名 (author) K. Shinkai,M. Hashimoto
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Kenichi(Ken-ichi) Shinkai, Masanori Hashimoto
表題 (title) Device-Parameter Estimation with On-chip Variation Sensors Considering Random Variability
表題 (英文)
書籍・会議録表題 (booktitle) Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 683-688
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) January
出版年 (year) 2011
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) Abstract—Device-parameter monitoring sensors inside a chip
are gaining its importance as the post-fabrication tuning is becoming
of a practical use. In estimation of variational parameters
using on-chip sensors, it is often assumed that the outputs of
variation sensors are not affected by random variations. However,
random variations can deteriorate the accuracy of the estimation
result. In this paper, we propose a device-parameter estimation
method with on-chip variation sensors explicitly considering
random variability. The proposed method derives the global
variation parameters and the standard deviation of the random
variability using the maximum likelihood estimation. We
experimentally verified that the proposed method can accurately
estimate variations, whereas the estimation result deteriorates
when neglecting random variations. We also demonstrate an
application result of the proposed method to test chips fabricated
in a 65-nm process technology.
論文電子ファイル


[1-219]  K. Shinkai and M. Hashimoto, ``Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability,'' In Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 683-688, January 2011.

@inproceedings{1_219,
    author = {K. Shinkai and M. Hashimoto},
    author_e = {},
    editor = {},
    editor_e = {},
    title = {Device-Parameter Estimation with On-chip Variation Sensors
    Considering Random Variability},
    title_e = {},
    booktitle = {Proceedings of IEEE/ACM Asia and South Pacific Design
    Automation Conference (ASP-DAC)},
    booktitle_e = {},
    volume = {},
    number = {},
    pages = {683-688},
    organization = {},
    publisher = {},
    publisher_e = {},
    address = {},
    month = {January},
    year = {2011},
    note = {},
    annote = {}
}

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