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分類 国際会議
著者名 (author) K. Shinkai,M. Hashimoto
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Kenichi(Ken-ichi) Shinkai, Masanori Hashimoto
表題 (title) A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability
表題 (英文)
書籍・会議録表題 (booktitle) Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 79-84
組織名 (organization) ACM/IEEE
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) February
出版年 (year) 2009
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) This paper proposes a gate delay model suitable for timing analysis
considering wide-ranging process and environmental variability.
We focus on current variation and consider its impact on
delay by replacing the output load. Our model can be used in
both statistical timing analysis and corner-based timing analysis.
We improve the accuracy of our preliminary model by innovating
the estimation of the input voltage at the timing when the
output voltage goes across half of the supply voltage. We also
reduce the delay estimation error by improving the estimation of
transition starting time. Experimental results in a 90-nm technology
show that these techniques reduce the RMS error from
9.35% in our preliminary work to 5.19%. Our model can calculate
the sensitivity for statistical analysis on the fly even in the
case that the nominal operating condition changes, and the error
of the standard deviation is reduced from -22.7% to 1.6% using
updated sensitivities in a test case.
論文電子ファイル


[1-201]  K. Shinkai and M. Hashimoto, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 79-84, February 2009.

@inproceedings{1_201,
    author = {K. Shinkai and M. Hashimoto},
    author_e = {},
    editor = {},
    editor_e = {},
    title = {A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range
    of Process and Environmental Variability},
    title_e = {},
    booktitle = {Proc. International Workshop on Timing Issues in the
    Specification and Synthesis of Digital Systems (TAU)},
    booktitle_e = {},
    volume = {},
    number = {},
    pages = {79-84},
    organization = {ACM/IEEE},
    publisher = {},
    publisher_e = {},
    address = {},
    month = {February},
    year = {2009},
    note = {},
    annote = {}
}

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