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分類 国際会議
著者名 (author) H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Hiroshi Fuketa, Masanori Hashimoto, Yukio Mitsuyama, Takao Onoye
表題 (title) Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-biased Circuits and Subthreshold Circuits
表題 (英文)
書籍・会議録表題 (booktitle) ICCAD Colocated Workshop on Test Structure Design for Variability Characterization
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) November
出版年 (year) 2008
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-197]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits,'' In ICCAD Colocated Workshop on Test Structure Design for Variability Characterization, November 2008.

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    author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
    author_e = {},
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    title = {Vth Variation Modeling and Its Validation with Ring Oscillation
    Frequencies for Body-biased Circuits and Subthreshold Circuits},
    title_e = {},
    booktitle = {ICCAD Colocated Workshop on Test Structure Design for
    Variability Characterization},
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    pages = {},
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    month = {November},
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