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分類 国際会議
著者名 (author) H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Hiroshi Fuketa, Masanori Hashimoto, Yukio Mitsuyama, Takao Onoye
表題 (title) Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits
表題 (英文)
書籍・会議録表題 (booktitle) Proc. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 3-8
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) August
出版年 (year) 2008
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-196]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits,'' In Proc. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pp. 3-8, August 2008.

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    author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
    author_e = {},
    editor = {},
    editor_e = {},
    title = {Correlation Verification between Transistor Variability Model with
    Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits},
    title_e = {},
    booktitle = {Proc. IEEE/ACM International Symposium on Low Power Electronics
    and Design (ISLPED)},
    booktitle_e = {},
    volume = {},
    number = {},
    pages = {3-8},
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    month = {August},
    year = {2008},
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}

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