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分類 国際会議
著者名 (author) K. Shinkai,M. Hashimoto,A. Kurokawa,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Kenichi(Ken-ichi) Shinkai, Masanori Hashimoto, Atsushi Kurokawa, Takao Onoye
表題 (title) A Gate Delay Model Focusing on Current Fluctuation over Wide-Range of Process and Environmental Variability
表題 (英文)
書籍・会議録表題 (booktitle) Proc. International Conference on Computer-Aided Design (ICCAD)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 47-53
組織名 (organization) ACM/IEEE
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) November
出版年 (year) 2006
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-180]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Conference on Computer-Aided Design (ICCAD), pp. 47-53, November 2006.

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    author = {K. Shinkai and M. Hashimoto and A. Kurokawa and T. Onoye},
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    editor_e = {},
    title = {A Gate Delay Model Focusing on Current Fluctuation over Wide-Range
    of Process and Environmental Variability},
    title_e = {},
    booktitle = {Proc. International Conference on Computer-Aided Design (ICCAD)},
    
    booktitle_e = {},
    volume = {},
    number = {},
    pages = {47-53},
    organization = {ACM/IEEE},
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    month = {November},
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