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分類 国際会議
著者名 (author) Y. Konno, K. Nakamura, T. Bitoh, K. Saga, S. Yano
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) , , , , Seiken Yano
表題 (title) A Consistent Scan Design System for Large-Scale {ASICs}
表題 (英文)
書籍・会議録表題 (booktitle) in Proc. Fifth Asian Test Symposium
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 82-87
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) November
出版年 (year) 1996
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-17]  Y. Konno, K. Nakamura, T. Bitoh, K. Saga, and S. Yano, ``A Consistent Scan Design System for Large-Scale ASICs,'' In in Proc. Fifth Asian Test Symposium, pp. 82-87, November 1996.

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    title = {A Consistent Scan Design System for Large-Scale {ASICs}},
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    booktitle = {in Proc. Fifth Asian Test Symposium},
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    volume = {},
    number = {},
    pages = {82-87},
    organization = {},
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