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分類 国際会議
著者名 (author) Y. Ogasahara,T. Enami,M. Hashimoto,T. Sato,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Yasuhiro Ogasahara, Takashi Enami, Masanori Hashimoto, Takashi Sato, Takao Onoye
表題 (title) Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated With Full-Chip Simulation
表題 (英文)
書籍・会議録表題 (booktitle) Proc.~IEEE Custom Integrated Circuits Conference
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 861--864
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) September
出版年 (year) 2006
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-155]  Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, ``Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation,'' In Proc.~IEEE Custom Integrated Circuits Conference, pp. 861--864, September 2006.

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    title = {Measurement Results of Delay Degradation Due to Power Supply Noise
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    booktitle = {Proc.~IEEE Custom Integrated Circuits Conference},
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    volume = {},
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    pages = {861--864},
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    month = {September},
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