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分類 国際会議
著者名 (author) K. Shinkai,M. Hashimoto,A. Kurokawa,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Kenichi(Ken-ichi) Shinkai, Masanori Hashimoto, Atsushi Kurokawa, Takao Onoye
表題 (title) A Gate Delay Model Focusing on Current Fluctuation over Wide-Range of Process and Environmental Variability
表題 (英文)
書籍・会議録表題 (booktitle) Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 59-64
組織名 (organization) ACM/IEEE
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) February
出版年 (year) 2006
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-150]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 59-64, February 2006.

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    title = {A Gate Delay Model Focusing on Current Fluctuation over Wide-Range
    of Process and Environmental Variability},
    title_e = {},
    booktitle = {Proc. International Workshop on Timing Issues in the
    Specification and Synthesis of Digital Systems (TAU)},
    booktitle_e = {},
    volume = {},
    number = {},
    pages = {59-64},
    organization = {ACM/IEEE},
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    month = {February},
    year = {2006},
    note = {},
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}

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