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分類 論文誌
著者名 (author) S. Hirokawa,R. Harada,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
表題 (title) Characterizing alpha- and neutron-induced SEU and MCU on SOTB and bulk 0.4-V SRAMs
表題 (英文)
定期刊行物名 (journal) IEEE Transactions on Nuclear Science
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) April
出版年 (year) 2015
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[0-170]  S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, ``Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams,'' IEEE Transactions on Nuclear Science, April 2015.

@article{0_170,
    author = {S. Hirokawa and R. Harada and M. Hashimoto and T. Onoye},
    author_e = {},
    title = {Characterizing alpha- and neutron-induced SEU and MCU on SOTB and
    bulk 0.4-V SRAMs},
    title_e = {},
    journal = {IEEE Transactions on Nuclear Science},
    journal_e = {},
    volume = {},
    number = {},
    pages = {},
    month = {April},
    year = {2015},
    note = {},
    annote = {}
}

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