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分類 論文誌
著者名 (author) H. Fuketa,R. Harada,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
表題 (title) Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM
表題 (英文)
定期刊行物名 (journal) IEEE Transactions on Device and Materials Reliability
定期刊行物名 (英文)
巻数 (volume) 14
号数 (number) 1
ページ範囲 (pages) 463 -- 470
刊行月 (month) March
出版年 (year) 2014
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[0-166]  H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, ``Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram,'' IEEE Transactions on Device and Materials Reliability, vol. 14, no. 1, p. 463 -- 470, March 2014.

@article{0_166,
    author = {H. Fuketa and R. Harada and M. Hashimoto and T. Onoye},
    author_e = {},
    title = {Measurement and Analysis of Alpha-Particle-Induced Soft Errors and
    Multiple Cell Upsets in 10T Subthreshold SRAM},
    title_e = {},
    journal = {IEEE Transactions on Device and Materials Reliability},
    journal_e = {},
    volume = {14},
    number = {1},
    pages = {463 -- 470},
    month = {March},
    year = {2014},
    note = {},
    annote = {}
}

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