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分類 論文誌
著者名 (author) T. Sato,J. Ichimiya,N. Ono,M. Hashimoto
英文著者名 (author)
キー (key)
表題 (title) On-chip thermal gradient analysis considering interdependence between leakage power and temperature
表題 (英文)
定期刊行物名 (journal) IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
定期刊行物名 (英文)
巻数 (volume) E89-A
号数 (number) 12
ページ範囲 (pages) 3491-3499
刊行月 (month) December
出版年 (year) 2006
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[0-121]  T. Sato, J. Ichimiya, N. Ono, and M. Hashimoto, ``On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3491-3499, December 2006.

@article{0_121,
    author = {T. Sato and J. Ichimiya and N. Ono and M. Hashimoto},
    author_e = {},
    title = {On-chip thermal gradient analysis considering interdependence
    between leakage power and temperature},
    title_e = {},
    journal = {IEICE Trans. on Fundamentals of Electronics, Communications and
    Computer Sciences},
    journal_e = {},
    volume = {E89-A},
    number = {12},
    pages = {3491-3499},
    month = {December},
    year = {2006},
    note = {},
    annote = {}
}

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