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分類 論文誌
著者名 (author) S. Yano, N. Ishiura
英文著者名 (author) S. Yano, N. Ishiura
キー (key) Seiken Yano,
表題 (title) Embedded Memory Array Testing Using a Scannable Configuration
表題 (英文) Embedded Memory Array Testing Using a Scannable Configuration
定期刊行物名 (journal) IEICE Trans.\ Fundamentals of Electronics,Communications and Computer Sciences
定期刊行物名 (英文) IEICE Trans. Fundamentals of Electronics,Communications and Computer Sciences
巻数 (volume) E80-A
号数 (number) 10
ページ範囲 (pages) 1934-1944
刊行月 (month) October
出版年 (year) 1997
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[0-11]  S. Yano and N. Ishiura, ``Embedded Memory Array Testing Using a Scannable Configuration,'' IEICE Trans.\ Fundamentals of Electronics,Communications and Computer Sciences, vol. E80-A, no. 10, pp. 1934-1944, October 1997.

@article{0_11,
    author = {S. Yano and  N. Ishiura},
    author_e = {S. Yano, N. Ishiura},
    title = {Embedded Memory Array Testing Using a Scannable Configuration},
    title_e = {Embedded Memory Array Testing Using a Scannable Configuration},
    journal = {IEICE Trans.\ Fundamentals of Electronics,Communications and
    Computer Sciences},
    journal_e = {IEICE Trans. Fundamentals of Electronics,Communications and
    Computer Sciences},
    volume = {E80-A},
    number = {10},
    pages = {1934-1944},
    month = {October},
    year = {1997},
    note = {},
    annote = {}
}

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