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分類 論文誌
著者名 (author) H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye
英文著者名 (author)
キー (key)
表題 (title) Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
表題 (英文)
定期刊行物名 (journal) IEEE Transactions on Nuclear Science
定期刊行物名 (英文)
巻数 (volume) 58
号数 (number) 4
ページ範囲 (pages) 2097--2102
刊行月 (month) August
出版年 (year) 2011
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[0-101]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Transactions on Nuclear Science, vol. 58, no. 4, pp. 2097--2102, August 2011.

@article{0_101,
    author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
    author_e = {},
    title = {Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T
    Subthreshold SRAM},
    title_e = {},
    journal = {IEEE Transactions on Nuclear Science},
    journal_e = {},
    volume = {58},
    number = {4},
    pages = {2097--2102},
    month = {August},
    year = {2011},
    note = {},
    annote = {}
}

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