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| T. Uemura and M. Hashimoto, "Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. | |
| ID | 818 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag |
| 表題 (英文) |
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| 著者名 (author) |
T. Uemura,M. Hashimoto |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of International Symposium on Reliability Physics (IRPS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2015 |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id818,
title = {Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag},
author = {T. Uemura and M. Hashimoto},
journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
month = {4},
year = {2015},
}
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