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T. Uemura and M. Hashimoto, "Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. | |
ID | 818 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag |
表題 (英文) |
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著者名 (author) |
T. Uemura,M. Hashimoto |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of International Symposium on Reliability Physics (IRPS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
4 |
出版年 (year) |
2015 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id818, title = {Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag}, author = {T. Uemura and M. Hashimoto}, journal = {Proceedings of International Symposium on Reliability Physics (IRPS)}, month = {4}, year = {2015}, } |