尾上研究室 研究業績一覧: T. Uemura and M. Hashimoto, Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag, April 2015.
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T. Uemura and M. Hashimoto, "Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.
ID 818
分類 国際会議
タグ
表題 (title) Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag
表題 (英文)
著者名 (author) T. Uemura,M. Hashimoto
英文著者名 (author)
キー (key)
定期刊行物名 (journal) Proceedings of International Symposium on Reliability Physics (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 4
出版年 (year) 2015
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id818,
         title = {Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag},
        author = {T. Uemura and M. Hashimoto},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2015},
}
  

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