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S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams," IEEE Transactions on Nuclear Science, April 2015. | |
ID | 800 |
分類 | 論文誌 |
タグ | |
表題 (title) |
Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams |
表題 (英文) |
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著者名 (author) |
S. Hirokawa,R. Harada,M. Hashimoto,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
4 |
出版年 (year) |
2015 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id800, title = {Characterizing alpha- and neutron-induced SEU and MCU on SOTB and bulk 0.4-V SRAMs}, author = {S. Hirokawa and R. Harada and M. Hashimoto and T. Onoye}, journal = {IEEE Transactions on Nuclear Science}, month = {4}, year = {2015}, } |