尾上研究室 研究業績一覧: M. Hashimoto, Robust Subthreshold Circuit Design to Manufacturing and Environmental Variability (Invited), March 2013.
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M. Hashimoto, "Robust Subthreshold Circuit Design to Manufacturing and Environmental Variability (Invited)," China Semiconductor Technology International Conference (CSTIC), pp. 1079--1084, March 2013.
ID 736
分類 国際会議
タグ
表題 (title) Robust Subthreshold Circuit Design to Manufacturing and Environmental Variability (Invited)
表題 (英文)
著者名 (author) M. Hashimoto
英文著者名 (author)
キー (key)
定期刊行物名 (journal) China Semiconductor Technology International Conference (CSTIC)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 1079--1084
刊行月 (month) 3
出版年 (year) 2013
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id736,
         title = {Robust Subthreshold Circuit Design to Manufacturing and Environmental Variability (Invited)},
        author = {M. Hashimoto},
       journal = {China Semiconductor Technology International Conference (CSTIC)},
         pages = {1079--1084},
         month = {3},
          year = {2013},
}
  

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