尾上研究室 研究業績一覧: T.Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices, August 2013.
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T.Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices," IEICE Trans. on Information and Systems , E96-D(8), pp. 1624--1631, August 2013.
ID 722
分類 論文誌
タグ
表題 (title) Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
表題 (英文)
著者名 (author) T.Kameda,H. Konoura,D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
定期刊行物名 (journal) IEICE Trans. on Information and Systems
定期刊行物名 (英文)
巻数 (volume) E96-D
号数 (number) 8
ページ範囲 (pages) 1624--1631
刊行月 (month) 8
出版年 (year) 2013
Impact Factor (JCR)
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付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id722,
         title = {Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices},
        author = {T.Kameda and H. Konoura and D. Alnajjar and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Information and Systems },
        volume = {E96-D},
        number = {8},
         pages = {1624--1631},
         month = {8},
          year = {2013},
}
  

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