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| D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing," In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 313-316, November 2013. | |
| ID | 671 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing |
| 表題 (英文) |
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| 著者名 (author) |
D. Alnajjar,H. Konoura,Y. Mitsuyama,H. Shimada,K. Kobayashi,H. Kanbara,H. Ochi,T. Imagawa,S. Noda,K. Wakabayashi,M. Hashimoto,T. Onoye,H. Onodera |
| 英文著者名 (author) |
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| 編者名 (editor) |
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| 編者名 (英文) |
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| キー (key) |
D. Alnajjar,H. Konoura,Y. Mitsuyama,H. Shimada,K. Kobayashi,H. Kanbara,H. Ochi,T. Imagawa,S. Noda,K. Wakabayashi,M. Hashimoto,T. Onoye,H. Onodera |
| 書籍・会議録表題 (booktitle) |
Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC) |
| 書籍・会議録表題(英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
313-316 |
| 組織名 (organization) |
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| 出版元 (publisher) |
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| 出版元 (英文) |
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| 出版社住所 (address) |
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| 刊行月 (month) |
11 |
| 出版年 (year) |
2013 |
| 採択率 (acceptance) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@inproceedings{id671,
title = {Reliability-configurable mixed-grained reconfigurable array supporting C-to-array mapping and its radiation testing},
author = {D. Alnajjar and H. Konoura and Y. Mitsuyama and H. Shimada and K. Kobayashi and H. Kanbara and H. Ochi and T. Imagawa and S. Noda and K. Wakabayashi and M. Hashimoto and T. Onoye and H. Onodera},
booktitle = {Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC)},
pages = {313-316},
month = {11},
year = {2013},
}
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