尾上研究室 研究業績一覧: R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects, April 2012.
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R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012.
ID 647
分類 国際会議
タグ
表題 (title) Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects
表題 (英文)
著者名 (author) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
定期刊行物名 (journal) Proceedings of International Reliability Physics Symposium (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 4
出版年 (year) 2012
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付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id647,
         title = {SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-die Process Variation Effects},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2012},
}
  

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