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| R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012. | |
| ID | 647 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects |
| 表題 (英文) |
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| 著者名 (author) |
R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2012 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id647,
title = {SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-die Process Variation Effects},
author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
month = {4},
year = {2012},
}
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