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R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012. | |
ID | 647 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects |
表題 (英文) |
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著者名 (author) |
R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
4 |
出版年 (year) |
2012 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id647, title = {SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-die Process Variation Effects}, author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye}, journal = {Proceedings of International Reliability Physics Symposium (IRPS)}, month = {4}, year = {2012}, } |