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| T. Sato, J. Ichimiya, N. Ono, and M. Hashimoto, "On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, E89-A(12), pp. 3491-3499, December 2006. | |
| ID | 573 |
| 分類 | 論文誌 |
| タグ | |
| 表題 (title) |
On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature |
| 表題 (英文) |
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| 著者名 (author) |
T. Sato,J. Ichimiya,N. Ono,M. Hashimoto |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
E89-A |
| 号数 (number) |
12 |
| ページ範囲 (pages) |
3491-3499 |
| 刊行月 (month) |
12 |
| 出版年 (year) |
2006 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id573,
title = {On-chip thermal gradient analysis considering interdependence between leakage power and temperature},
author = {T. Sato and J. Ichimiya and N. Ono and M. Hashimoto},
journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
volume = {E89-A},
number = {12},
pages = {3491-3499},
month = {12},
year = {2006},
}
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