尾上研究室 研究業績一覧: K. Shinkai and M. Hashimoto, Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability, January 2011.
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K. Shinkai and M. Hashimoto, "Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability," In Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 683-688, January 2011.
ID 519
分類 国際会議
タグ
表題 (title) Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability
表題 (英文)
著者名 (author) K. Shinkai,M. Hashimoto
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Kenichi(Ken-ichi) Shinkai, Masanori Hashimoto
書籍・会議録表題 (booktitle) Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 683-688
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 1
出版年 (year) 2011
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) Abstract—Device-parameter monitoring sensors inside a chip
are gaining its importance as the post-fabrication tuning is becoming
of a practical use. In estimation of variational parameters
using on-chip sensors, it is often assumed that the outputs of
variation sensors are not affected by random variations. However,
random variations can deteriorate the accuracy of the estimation
result. In this paper, we propose a device-parameter estimation
method with on-chip variation sensors explicitly considering
random variability. The proposed method derives the global
variation parameters and the standard deviation of the random
variability using the maximum likelihood estimation. We
experimentally verified that the proposed method can accurately
estimate variations, whereas the estimation result deteriorates
when neglecting random variations. We also demonstrate an
application result of the proposed method to test chips fabricated
in a 65-nm process technology.
論文電子ファイル 2.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@inproceedings{id519,
         title = {Device-Parameter Estimation with On-chip Variation Sensors Considering Random Variability},
        author = {K. Shinkai and M. Hashimoto},
     booktitle = {Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC)},
         pages = {683-688},
         month = {1},
          year = {2011},
}
  

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