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| K. Shinkai and M. Hashimoto, "Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability," In Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 683-688, January 2011. | |
| ID | 519 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability |
| 表題 (英文) |
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| 著者名 (author) |
K. Shinkai,M. Hashimoto |
| 英文著者名 (author) |
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| 編者名 (editor) |
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| 編者名 (英文) |
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| キー (key) |
Kenichi(Ken-ichi) Shinkai, Masanori Hashimoto |
| 書籍・会議録表題 (booktitle) |
Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC) |
| 書籍・会議録表題(英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
683-688 |
| 組織名 (organization) |
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| 出版元 (publisher) |
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| 出版元 (英文) |
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| 出版社住所 (address) |
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| 刊行月 (month) |
1 |
| 出版年 (year) |
2011 |
| 採択率 (acceptance) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
Abstract—Device-parameter monitoring sensors inside a chip are gaining its importance as the post-fabrication tuning is becoming of a practical use. In estimation of variational parameters using on-chip sensors, it is often assumed that the outputs of variation sensors are not affected by random variations. However, random variations can deteriorate the accuracy of the estimation result. In this paper, we propose a device-parameter estimation method with on-chip variation sensors explicitly considering random variability. The proposed method derives the global variation parameters and the standard deviation of the random variability using the maximum likelihood estimation. We experimentally verified that the proposed method can accurately estimate variations, whereas the estimation result deteriorates when neglecting random variations. We also demonstrate an application result of the proposed method to test chips fabricated in a 65-nm process technology. |
| 論文電子ファイル | 2.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@inproceedings{id519,
title = {Device-Parameter Estimation with On-chip Variation Sensors Considering Random Variability},
author = {K. Shinkai and M. Hashimoto},
booktitle = {Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC)},
pages = {683-688},
month = {1},
year = {2011},
}
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