尾上研究室 研究業績一覧: K. Shinkai and M. Hashimoto, Self-Heating in Nano-Scale Vlsi Interconnects, August 2010.
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K. Shinkai and M. Hashimoto, "Self-Heating in Nano-Scale Vlsi Interconnects," In Proceedings of International Workshop on Information Communication Technology (ICT), S-1-6, August 2010.
ID 518
分類 国際会議
タグ
表題 (title) Self-Heating in Nano-Scale Vlsi Interconnects
表題 (英文)
著者名 (author) K. Shinkai,M. Hashimoto
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Ken-ichi(Kenichi) Shinkai, Masanori Hashimoto
書籍・会議録表題 (booktitle) Proceedings of International Workshop on Information Communication Technology (ICT)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) S-1-6
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 8
出版年 (year) 2010
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) Abstract—This paper investigates the self-heating effect in
nano-scale local and global interconnects. Our prediction indicates
that the self-heating effect in local signal wires will be
greater than that in optimal repeater-inserted global wires. In
local wires, the maximum temperature increase from the silicon
junction temperature will reach 40.4◦C in a steady state at a
14-nm process. Our attribution analysis also demonstrates that
miniaturizing the area of wire cross-section exacerbates selfheating
as well as using low-κ material and increased power
dissipation in advanced technologies below 28 nm. It is revealed
that the impact of self-heating on performance in local wires
is limited, while underestimating the temperature may cause an
unexpected reliability failure.
論文電子ファイル 2.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@inproceedings{id518,
         title = {Self-Heating in Nano-Scale VLSI Interconnects},
        author = {K. Shinkai and M. Hashimoto},
     booktitle = {Proceedings of International Workshop on Information Communication Technology (ICT)},
         pages = {S-1-6},
         month = {8},
          year = {2010},
}
  

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