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| S. Yano and N. Ishiura, "Embedded Memory Array Testing Using a Scannable Configuration," IEICE Trans. Fundamentals of Electronics,Communications and Computer Sciences, E80-A(10), pp. 1934-1944, October 1997. | |
| ID | 12 |
| 分類 | 論文誌 |
| タグ | |
| 表題 (title) |
Embedded Memory Array Testing Using a Scannable Configuration |
| 表題 (英文) |
Embedded Memory Array Testing Using a Scannable Configuration |
| 著者名 (author) |
S. Yano, N. Ishiura |
| 英文著者名 (author) |
S. Yano, N. Ishiura |
| キー (key) |
Seiken Yano, |
| 定期刊行物名 (journal) |
IEICE Trans.\ Fundamentals of Electronics,Communications and Computer Sciences |
| 定期刊行物名 (英文) |
IEICE Trans. Fundamentals of Electronics,Communications and Computer Sciences |
| 巻数 (volume) |
E80-A |
| 号数 (number) |
10 |
| ページ範囲 (pages) |
1934-1944 |
| 刊行月 (month) |
10 |
| 出版年 (year) |
1997 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id12,
title = {Embedded Memory Array Testing Using a Scannable Configuration},
author = {S. Yano and N. Ishiura},
journal = {IEICE Trans.\ Fundamentals of Electronics,Communications and Computer Sciences},
volume = {E80-A},
number = {10},
pages = {1934-1944},
month = {10},
year = {1997},
}
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