論文誌

[1] S. Iizuka, Y. Higuchi, M. Hashimoto, and T. Onoye, "Device-Parameter Estimation with Sensitivity-Configurable Ring Oscillator," IEICE Trans. Fundamentals of Electronics Communications and Computer Sciences, volume E98-A, number 12, pages 2607--2613, December 2015.

[2] D. Fukuda, K. Watanabe, Y. Kanazawa, and M. Hashimoto, "Modeling the Effect of Global Layout Pattern on Wire Width Variation for On-The-Fly Etching Process Modification," IEICE Trans. Fundamentals of Electronics Communications and Computer Sciences, volume E98-A, number 7, pages 1467--1474, July 2015.

[3] T. Shinada, M. Hashimoto, and T. Onoye, "Proximity Distance Estimation Based on Electric Field Communication between 1mm³ Sensor Nodes," Analog Integrated Circuits and Signal Processing, May 2015.

[4] S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams," IEEE Transactions on Nuclear Science, April 2015.

[5] T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, and M. Hashimoto, "Exploring Well-Configurations for Minimizing Single Event Latchup," IEEE Transactions on Nuclear Science, volume 61, number 6, pages 3282--3289, December 2014.

[6] H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 12, pages 2518--2529, December 2014.

[7] T. Amaki, M. Hashimoto, and T. Onoye, "A Process and Temperature Tolerant Oscillator-Based True Random Number Generator," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 12, pages 2393--2399, December 2014.

[8] D. Fukuda, K. Watanabe, N. Idani, Y. Kanazawa, and M. Hashimoto, "Edge-Over-Erosion Error Prediction Method Based on Multi-Level Machine Learning Algorithm," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 12, pages 2373--2382, December 2014.

[9] H. Konoura, T. Imagawa, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1468--1482, July 2014.

[10] H. Konoura, T. Kameda, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Nbti Mitigation Method by Inputting Random Scan-In Vectors in Standby Time," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1483--1491, July 2014.

[11] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Set Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1461--1467, July 2014.

[12] H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram," IEEE Transactions on Device and Materials Reliability, volume 14, number 1, 463 -- 470, March 2014.

[13] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Mitigating Multi-Bit-Upset with Well-Slits in 28 Nm Multi-Bit-Latch," IEEE Transactions on Nuclear Science, volume 60, number 6, pages 4362--4367, December 2013.

[14] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft-Error in Sram at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment," IEEE Transactions on Nuclear Science, volume 60, number 6, pages 4232--4237, December 2013.

[15] D. Alnajjar, H. Konoura, Y. Ko, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture," IEEE Transactions on VLSI Systems, volume 21, number 12, 2165 -- 2178, December 2013.

[16] K. Shinkai, M. Hashimoto, and T. Onoye, "A Gate-Delay Model Focusing on Current Fluctuation Over Wide Range of Process-Voltage-Temperature Variations," Integration, the VLSI Journal, volume 46, number 4, pages 345--358, September 2013.

[17] T.Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices," IEICE Trans. on Information and Systems , volume E96-D, number 8, pages 1624--1631, August 2013.

[18] T. Amaki, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "A Worst-Case-Aware Design Methodology for Noise-Tolerant Oscillator-Based True Random Number Generator with Stochastic Behavior Modeling," IEEE Transactions on Information Forensics and Security, volume 8, number 8, pages 1331--1342, August 2013.

[19] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement," IEEE Transactions on Nuclear Science, volume 60, number 4, pages 2630--2634, August 2013.

[20] D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Pvt-Induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices," IEICE Electronics Express (ELEX), volume 10, number 5, April 2013.

[21] Y. Ogasahara, M. Hashimoto, T. Kanamoto, and T. Onoye, "Supply Noise Suppression by Triple-Well Structure," IEEE Transactions on VLSI Systems, volume 21, number 4, pages 781--785, April 2013.

[22] I. Homjakovs, T. Hirose, Y. Osaki, M. Hashimoto, and T. Onoye, "A 0.8-V 110-Na Cmos Current Reference Circuit Using Subthreshold Operation," IEICE Electronics Express (ELEX), volume 10, number 4, March 2013.

[23] T. Amaki, M. Hashimoto, and T. Onoye, "Jitter Amplifier for Oscillator-Based True Random Number Generator," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E96-A, number 3, pages 684--696, March 2013.

[24] I. Homjakovs, M. Hashimoto, T. Hirose, and T. Onoye, "Signal-Dependent Analog-To-Digital Conversion Based on Minimax Sampling," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E96-A, number 2, pages 459--468, February 2013.

[25] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," IEEE Transactions on Nuclear Science, volume 59, number 6, pages 2791--2795, December 2012.

[26] T. Enami, T. Sato, and M. Hashimoto, "Power Distribution Network Optimization for Timing Improvement with Statistical Noise Model and Timing Analysis," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E95-A, number 12, pages 2261--2271, December 2012.

[27] Y. Takai, M. Hashimoto, and T. Onoye, "Power Gating Implementation for Supply Noise Mitigation with Body-Tied Triple-Well Structure," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E95-A, number 12, pages 2220--2225, December 2012.

[28] S. Kimura, M. Hashimoto, and T. Onoye, "A Body Bias Clustering Method for Low Test-Cost Post-Silicon Tuning," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E95-A, number 12, pages 2292--2300, December 2012.

[29] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Adaptive Performance Compensation with In-Situ Timing Error Predictive Sensors for Subthreshold Circuits," IEEE Transactions on VLSI Systems, volume 20, number 2, pages 333--343, February 2012.

[30] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Stress Probability Computation for Estimating NBTI-Induced Delay Degradation," IEICE Trans. Fundamentals, volume E94-A, number 12, pages 2545-2553, December 2011.

[31] K. Shinkai, M. Hashimoto, and T. Onoye, "Extracting Device-Parameter Variations with Ro-Based Sensors," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E94-A, number 12, pages 2537--2544, December 2011.

[32] T. Okumura and M. Hashimoto, "Setup Time, Hold Time and Clock-To-Q Delay Computation under Dynamic Supply Noise," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E94-A, number 10, pages 1948--1953, October 2011.

[33] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," IEEE Transactions on Nuclear Science, volume 58, number 4, pages 2097--2102, August 2011.

[34] H. Fuketa, D. Kuroda, M. Hashimoto, and T. Onoye, "An Average-Performance-Oriented Subthreshold Processor Self-Timed by Memory Read Completion," IEEE Transactions on Circuits and Systems II, volume 58, number 5, pages 299--303, May 2011.

[35] T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, "Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, volume 93-A, number 12, pages 2399-2408, December 2010.

[36] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," IEICE Transaction on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2417-2423, December 2010. [2.pdf]

[37] S. Ninomiya and M. Hashimoto, "Accuracy Enhancement of Grid-Based Ssta by Coefficient Interpolation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2441--2446, December 2010.

[38] T. Okumura, F. Minami, K. Shimazaki, K. Kuwada, and M. Hashimoto, "Gate Delay Estimation in Sta under Dynamic Power Supply Noise," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2447--2455, December 2010.

[39] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits," IEEE Transactions on VLSI Systems, volume 18, number 7, pages 1118--1129, July 2010.

[40] K. Shinkai, M. Hashimoto, and T. Onoye, "Prediction of Self-Heating in Short Intra-Block Wires," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 3, pages 583-594, March 2010. [2.pdf]

[41] T. Kanamoto, T. Okumura, K. Furukawa, H. Takafuji, A. Kurokawa, K. Hachiya, T. Sakata, M. Tanaka, H. Nakashima, H. Masuda, T. Sato, and M. Hashimoto, "Impact of Self-Heating in Wire Interconnection on Timing," IEICE Trans. on Electronics, volume E93-C, number 3, pages 388--392, March 2010.

[42] Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, and Y. Inoue, "Modeling the Overshooting Effect for Cmos Inverter Delay Analysis in Nanometer Technologies," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , volume 29, number 2, pages 250--260, February 2010.

[43] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Trade-Off Analysis between Timing Error Rate and Power Dissipation for Adaptive Speed Control with Timing Error Prediction," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, volume E92-A, number 12, pages 3094-3102, December 2009.

[44] T. Sakata, T. Okumura, A. Kurokawa, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto, K. Hachiya, K. Furukawa, M. Tanaka, H. Takafuji, and T. Kanamoto, "An Approach for Reducing Leakage Current Variation Due to Manufacturing Variability," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E92-A, number 12, pages 3016--3023, December 2009.

[45] A. Kurokawa, T. Sato, T. Kanamoto, and M. Hashimoto, "Interconnect Modeling: a Physical Design Perspective (Invited)," IEEE Transactions on Electron Devices, volume 56, number 9, pages 1840--1851, September 2009.

[46] Y. Ogasahara, M. Hashimoto, and T. Onoye, "All Digital Ring-Oscillator Based Macro for Sensing Dynamic Supply Noise Waveform," IEEE Journal of Solid-State Circuits, volume 44, number 6, pages 1745--1755, June 2009.

[47] T. Enami, S. Ninomiya, and M. Hashimoto, "Statistical Timing Analysis Considering Spatially and Temporally Correlated Dynamic Power Supply Noise," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, volume 28, number 4, pages 541-553, April 2009.

[48] T. Okumura, A. Kurokawa, H. Masuda, T. Kanamoto, M. Hashimoto, H. Takafuji, H. Nakashima, N. Ono, T. Sakata, and T. Sato, "Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume 92-A, number 4, pages 990--997, April 2009.

[49] K. Hamamoto, H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "An Experimental Study on Body-Biasing Layout Style Focusing on Area Efficiency and Speed Controllability," IEICE Trans. on Electronics, volume E92-C, number 2, pages 281-285, February 2009.

[50] T. Kanamoto, Y. Ogasahara, K. Natsume, K. Yamaguchi, H. Amishiro, T. Watanabe, and M. Hashimoto, "Impact of Well Edge Proximity Effect on Timing," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E91-A, number 12, pages 3461-3464, December 2008.

[51] S. Abe, M. Hashimoto, and T. Onoye, "Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E91-A, number 12, pages 3481-3487, December 2008.

[52] M. Hashimoto, J. Siriporn, A. Tsuchiya, H. Zhu, and C.-K. Cheng, "Analytical Eye-Diagram Model for On-Chip Distortionless Transmission Lines and Its Application to Design Space Exploration," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E91-A, number 12, pages 3474-3480, December 2008.

[53] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects," IEEE Journal of Solid-State Circuits, volume 43, number 3, pages 718-728, March 2008.

[54] M. Hashimoto, J. Yamaguchi, T. Sato, and H. Onodera, "Timing Analysis Considering Temporal Supply Voltage Fluctuation," IEICE Trans. on Information and Systems , volume E91-D, number 3, pages 655--660, March 2008.

[55] M. Hashimoto, T. Ijichi, S. Takahashi, S. Tsukiyama, and I. Shirakawa, "Transistor Sizing of LCD Driver Circuit for Technology Migration," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E90-A, number 12, pages 2712--2717, December 2007.

[56] M. Hashimoto, J. Yamaguchi, and H. Onodera, "Timing Analysis Considering Spatial Power/Ground Level Variation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E90-A, number 12, pages 2661-2668, December 2007.

[57] Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, "Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-Chip Delay Measurement," IEEE Trans. on Circuits and Systems—II: Express Briefs, volume 54, number 10, pages 868-872, October 2007.

[58] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Optimal Termination of On-Chip Transmission-Lines for High-Speed Signaling," IEICE Trans. on Electronics, volume E90-C, number 6, pages 1267-1273, June 2007.

[59] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise　and Tradeoff between Wire Cross Sectional Area and Inductive Crosstalk Effect," In IEICE Trans. on Fundamentals of Electronics,　Communications and Computer Sciences, volume E90-A, number 4, pages 724--731, April 2007.

[60] S. Takahashi, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, "A Sampling Switch Design Procedure for Active Matrix Liquid Crystal Displays," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3538--3545, December 2006.

[61] T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, "Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3560--3568, December 2006.

[62] S. Takahashi, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, "A Sampling Switch Design Procedure for Active Matrix Liquid Crystal Displays," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3538-3545, December 2006.

[63] T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, "Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3560-3568, December 2006.

[64] T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, "Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3560-3568, December 2006.

[65] T. Sato, J. Ichimiya, N. Ono, and M. Hashimoto, "On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3491-3499, December 2006.

[66] M. Hashimoto, T. Yamamoto, and H. Onodera, "Statistical Analysis of Clock Skew Variation in H-Tree Structure," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3375-3381, December 2005.

[67] A. Muramatsu, M. Hashimoto, and H. Onodera, "Effects of On-Chip Inductance on Power Distribution Grid," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3564-3572, December 2005.

[68] T. Sato, M. Hashimoto, and H. Onodera, "Successive Pad Assignment for Minimizing Supply Voltage Drop," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3429-3436, December 2005.

[69] T. Sato, J. Ichimiya, N. Ono, K. Hachiya, and M. Hashimoto, "On-Chip Thermal Gradient Analysis and Temperature Flattening for Soc Design," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3382-3389, December 2005.

[70] A. Kurokawa, M. Hashimoto, A. Kasebe, Z.-C. Huang, , Y. Yang, Y. Inoue, R. Inagaki, and H. Masuda, "Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3453-3462, December 2005.

[71] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Performance Limitation of On-Chip Global Interconnects for High-Speed Signaling," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Science, volume E88-A, number 4, pages 885-891, April 2005.

[72] T. Miyazaki, M. Hashimoto, and H. Onodera, "A Performance Prediction of Clock Generation Plls: a Ring Oscillator Based Pll and an Lc Oscillator Based Pll," IEICE Trans. on Electronics, volume E88-C, number 3, pages 437-444, March 2005.

[73] M. Hashimoto and H. Onodera, "Crosstalk Noise Optimization by Post-Layout Transistor Sizing," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E87-A, number 12, pages 3251-3257, December 2004.

[74] M. Hashimoto, Y. Yamada, and H. Onodera, "Equivalent Waveform Propagation for Static Timing Analysis," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , volume 23, number 4, pages 498-508, April 2004.

国際会議

[1] R. Shirai, T. Hirose, and M. Hashimoto, "{Dedicated Antenna Less Power Efficient Ook Transmitter for Mm-Cubic Iot Nodes}," Proceedings of the 47th European Microwave Conference (EuMC), pages 101--104, October 2017.

[2] M. Hashimoto, R. Shirai, Y. Itoh, and T. Hirose, "Toward Real-Time 3d Modeling System with Cubic-Millimeters Wireless Sensor Nodes (Invited)," Proceedings of IEEE International Conference on ASIC, pages 1087--1091, October 2017.

[3] R. Shirai, J. Kono, T. Hirose, and M. Hashimoto, "Near-Field Dual-Use Antenna for Magnetic-Field Based Communication and Electrical-Field Based Distance Sensing in Mm^3-Class Sensor Node," Proceedings of IEEE International Symposium on Circuits and Systems (ISCAS), pages 124--127, May 2017.

[4] Y. Masuda, M. Hashimoto, and T. Onoye, "Measurement of Timing Error Detection Performance of Software-Based Error Detection Mechanisms and Its Correlation with Simulation," In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 28-35, March 2016.

[5] R. Doi, J. Hotate, T. Kishimoto, T. Higashi, H. Ochi, M. Tada, T. Sugibayashi, K. Wakabayashi, H. Onodera, Y. Mitsuyama, and M. Hashimoto, "Highly-Dense Mixed Grained Reconfigurable Architecture with Via-Switch," ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2016.

[6] U. Schlichtmann, M. Hashimoto, I. H.-R. Jiang, and B. Li, "Reliability, Adaptability and Flexibility in Timing: Buy a Life Insurance for Your Circuits (Invited)," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 705--711, January 2016.

[7] N. Banno, M.Tada, K. Okamoto, N. Iguchi, T. Sakamoto, M. Miyamura, Y. Tsuji, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi Author(s) in English , "A Novel Two-Varistors (A-Si/Sin/A-Si) Selected Complementary Atom Switch (2v-1cas) for Nonvolatile Crossbar Switch with Multiple Fan-Outs," Technical Digest of IEEE International Electron Devices Meeting (IEDM), pages 32--35, December 2015.

[8] Y. Masuda, M. Hashimoto, and T. Onoye, "Performance Evaluation of Software-Based Error Detection Mechanisms for Localizing Electrical Timing Failures under Dynamic Supply Noise," In Proceedings of International Conference on Computer-Aided Design (ICCAD), pages 315-322, November 2015.

[9] R. Doi, M. Hashimoto, and T. Onoye, "An Analytic Evaluation on Soft Error Immunity Enhancement Due to Temporal Triplication," IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), November 2015.

[10] S. Iizuka, Y. Masuda, M. Hashimoto, and T. Onoye, "Stochastic Timing Error Rate Estimation under Process and Temporal Variations," In Proceedings of International Test Conference (ITC), October 2015.

[11] Y. Akihara, T. Hirose, Y. Tanaka, N. Kuroki, M. Numa, and M. Hashimoto, "A Wireless Power Transfer System for Small-Sized Sensor Applications," Proceedings of International Conference on Solid State Devices and Materials (SSDM), pages 154--155, September 2015.

[12] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced Seu and Mcu Rate Characterization and Analysis of Sotb and Bulk Srams at 0.3v Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.

[13] M. Ueno, M. Hashimoto, and T. Onoye, "Real-Time On-Chip Supply Voltage Sensor and Its Application to Trace-Based Timing Error Localization," Proceedings of International On-Line Testing Symposium (IOLTS), pages 188--193, July 2015.

[14] M. Hashimoto, "Run-Time Performance Adaptation: Opportunities and Challenges (Invited)," Proceedings of IEEE Conference on Electron Devices and Solid-State Circuits (EDSSC), June 2015.

[15] T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, "Impact of Package on Neutron Induced Single Event Upset in 20 Nm Sram," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.

[16] T. Uemura and M. Hashimoto, "Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.

[17] T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft Error Immune Latch Design for 20 Nm Bulk Cmos," Proceedings of International Reliability Physics Symposium (IRPS), April 2015.

[18] S. Ukawa, T. Shinada, M. Hashimoto, Y. Itoh, and T. Onoye, "3d Node Localization from Node-To-Node Distance Information Using Cross-Entropy Method," Proceedings of Virtual Reality Conference (VR), March 2015.

[19] S. Iizuka, Y. Higuchi, M. Hashimoto, and T. Onoye, "Area Efficient Device-Parameter Estimation Using Sensitivity-Configurable Ring Oscillator," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 731--736, January 2015.

[20] M. Hashimoto, D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Compatible with High-Level Synthesis," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 14--15, January 2015.

[21] T. Amaki, M. Hashimoto, and T. Onoye, "An Oscillator-Based True Random Number Generator with Process and Temperature Tolerance," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 4--5, January 2015.

[22] M. Hashimoto, "Stochastic Verification of Run-Time Performance Adaptation with Field Delay Testing (Invited)," Proceedings of Asia Pacific Conference on Circuits and Systems (APCCAS), pages 751--754, November 2014.

[23] M. Hashimoto, "Opportunities and Verification Challenges of Run-Time Performance Adaptation (Invited)," Proceedings of Asian Test Symposium (ATS), pages 248--253, November 2014.

[24] M. Hashimoto, "Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2014.

[25] A. Iokibe, M. Hashimoto, and T. Onoye, "Feasibility Evaluation on an Instant Invader Detection System with Ultrasonic Sensors Scattered on the Ground," Proceedings of International Conference on Sensing Technology (ICST), pages 188--193, September 2014.

[26] T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, and M. Hashimoto, "Optimizing Well-Configuration for Minimizing Single Event Latchup," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.

[27] R. Harada, S. Hirokawa, and M. Hashimoto, "Measurement of Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4 V Srams," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.

[28] T. Uemura, T. Kato, R. Tanabe, H. Iwata, H. Matsuyama, M. Hashimoto, K. Takahisa, M. Fukuda, and K. Hatanaka, "Preventing Single Event Latchup with Deep P-Well on P-Substrate," Proceedings of International Reliability Physics Symposium (IRPS), June 2014.

[29] M. Ueno, M. Hashimoto, and T. Onoye, "Trace-Based Fault Localization with Supply Voltage Sensor," ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2014.

[30] D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing," In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 313-316, November 2013.

[31] T. Amaki, M. Hashimoto, and T. Onoye, "A Process and Temperature Tolerant Oscillator-Based True Random Number Generator with Dynamic 0/1 Bias Correction," In Proceedings of Asian Solid-State Circuits Conference (A-SSCC), pages 133-136, November 2013.

[32] S. Iizuka, M. Mizuno, D. Kuroda, M. Hashimoto, and T. Onoye, "Stochastic Error Rate Estimation for Adaptive Speed Control with Field Delay Testing," In Proc. International Conference on Computer-Aided Design (ICCAD), pages 107-114, November 2013.

[33] J. Kono, M. Hashimoto, and T. Onoye, "Feasibility Evaluation of Near-Field Communication in Clay with 1-Mm^3 Antenna," Proceedings of Asia-Pacific Microwave Conference (APMC), pages 1121--1123, November 2013.

[34] R. Harada, M. Hashimoto, and T. Onoye, "Nbti Characterization Using Pulse-Width Modulation," IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.

[35] M. Hashimoto, "Soft Error Immunity of Subthreshold Sram (Invited)," Proceedings of IEEE International Conference on ASIC, pages 91--94, October 2013.

[36] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.

[37] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft-Error in Sram at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.

[38] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Mitigating Multi-Cell-Upset with Well-Slits in 28nm Multi-Bit-Latch," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.

[39] T. Shinada, M. Hashimoto, and T. Onoye, "Proximity Distance Estimation Based on Capacitive Coupling between 1mm^3 Sensor Nodes," Proceedings of International NEWCAS Conference, June 2013.

[40] M. Ueno, M. Hashimoto, and T. Onoye, "Real-Time Supply Voltage Sensor for Detecting/Debugging Electrical Timing Failures," Proceedings of Reconfigurable Architectures Workshop (RAW), pages 301--305, May 2013.

[41] Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, "Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator," Proceedings of IEEE European Test Symposium (ETS), pages 106--111, May 2013.

[42] M. Hashimoto, "Robust Subthreshold Circuit Design to Manufacturing and Environmental Variability (Invited)," China Semiconductor Technology International Conference (CSTIC), pages 1079--1084, March 2013.

[43] D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices," Proceedings of International Conference on ReConFigurable Computing and FPGAs (ReConFig), December 2012.

[44] I. Homjakovs, M. Hashimoto, T. Hirose, and T. Onoye, "Signal-Dependent Analog-To-Digital Converter Based on Minimax Sampling," Proceedings of International SoC Design Conference (ISOCC), 120 -- 123 , November 2012.

[45] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of Nbti-­Induced Pulse-Width Modulation on Set Pulse-Width Measurement," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2012.

[46] T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture," Proceedings of International Conference on Field Programmable Logic and Applications (FPL) , August 2012.

[47] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," IEEE Nuclear and Space Radiation Effects Conference, July 2012.

[48] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012.

[49] S. Kimura, M. Hashimoto, and T. Onoye, "Body Bias Clustering for Low Test-Cost Post-Silicon Tuning," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 283--289, February 2012.

[50] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architectures," In Proc. 21st International Conference on Field Programmable Logic and Applications (FPL2011), Chania, Crete, Greece, pages 189-194, September 2011.

[51] Y. Takai, M. Hashimoto, and T. Onoye, "Power Gating Implementation for Noise Mitigation with Body-Tied Triple-Well Structure," In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), September 2011.

[52] M. Hashimoto and H. Fuketa, "Adaptive Performance Compensation with On-Chip Variation Monitoring (Invited)," In Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS), August 2011.

[53] I. Homjakovs, M. Hashimoto, T. Hirose, and T. Onoye, "Signal-Dependent Analog-To-Digital Conversion Based on Minimax Sampling," In Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS), August 2011.

[54] T. Amaki, M. Hashimoto, and T. Onoye, "An Oscillator-Based True Random Number Generator with Jitter Amplifier," In Proc. IEEE International Symposium on Circuits and Systems (ISCAS 2011), pages 725-728, May 2011.

[55] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing," In Proc. International Reliability Physics Symposium (IRPS), April 2011.

[56] S. Kimura, M. Hashimoto, and T. Onoye, "Body Bias Clustering for Low Test-Cost Post-Silicon Tuning," In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 46--51, April 2011.

[57] K. Shinkai, M. Hashimoto, and T. Onoye, "Extracting Device-Parameter Variations with Ro-Based Sensors," In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 13--18, March 2011.

[58] D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Mttf Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," In IEEE Workshop on Silicon Errors in Logic - System Effects, March 2011.

[59] T. Amaki, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "A Design Procedure for Oscillator-Based Hardware Random Number Generator with Stochastic Behavior Modeling," In Proc. International Workshop on Information Security Applications (WISA 2010), pages 107-121, January 2011.

[60] T. Amaki, M. Hashimoto, and T. Onoye, "Jitter Amplifier for Oscillator-Based True Random Number Generator," In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC 2011), pages 81-82, January 2011.

[61] K. Shinkai and M. Hashimoto, "Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability," In Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC), pages 683-688, January 2011. [2.pdf]

[62] M. Hashimoto, "Run-Time Adaptive Performance Compensation Using On-Chip Sensors (Invited)," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 285--290, January 2011.

[63] M. Hatanaka, R. Hashimoto, T. Tatsuka, T. Onoye, H. Hatamoto, S. Ibi, S. Miyamoto, and S. Sampei, "VLSI Design of OFDM Baseband Transceiver with Dynamic Spectrum Access," In Proc. of the 18th International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS2010), pages 329-332, December 2010.

[64] Y. Takai, M. Hashimoto, and T. Onoye, "Evaluation of Power Gating Structures Focusing on Power Supply Noise with Measurement and Simulation," In Proceedings of IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), pages 213--216, October 2010.

[65] T. Okumura and M. Hashimoto, "Setup Time, Hold Time and Clock-To-Q Delay Computation under Dynamic Supply Noise," In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), September 2010.

[66] K. Shinkai and M. Hashimoto, "Self-Heating in Nano-Scale Vlsi Interconnects," In Proceedings of International Workshop on Information Communication Technology (ICT), S-1-6, August 2010. [2.pdf]

[67] S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, "Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors," In Proc. Great Lakes Symposium on VLSI (GLSVLSI), May 2010.

[68] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," In Proceedings of International Reliability Physics Symposium (IRPS), pages 213--217, May 2010.

[69] Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to Sso," In Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), pages 19--20, May 2010.

[70] D. Kuroda, H. Fuketa, M. Hashimoto, and T. Onoye, "A 16-Bit Risc Processor with 4.18pj/Cycle at 0.5v Operation," In Proceedings of IEEE COOL Chips, page 190, April 2010.

[71] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration," In Proc. International Symposium on Quality Electronic Design (ISQED), pages 646-651, March 2010.

[72] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," In Proc. International Symposium on Quality Electronic Design (ISQED), March 2010. [2.pdf]

[73] T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, "Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 41-46, March 2010.

[74] S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, "Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2010.

[75] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Adaptive Performance Control with Embedded Timing Error Predictive Sensors for Subthreshold Circuits," In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC), pages 361-362, January 2010.

[76] T. Okumura, F. Minami, K. Shimazaki, K. Kuwada, and M. Hashimoto, "Gate Delay Estimation in Sta under Dynamic Power Supply Noise," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), 775 -- 780, January 2010.

[77] D. Alnajjar, Y. Ko, T. Imagawa, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, "Soft Error Resilient Vlsi Architecture for Signal Processing," In Proceedings of IEEE International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS), pages 183--186, December 2009.

[78] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Adaptive Performance Compensation with In-Situ Timing Error Prediction for Subthreshold Circuits," In Proc. IEEE Custom Integrated Circuits Conference, pages 215-218, September 2009.

[79] R. Hashimoto, T. Tatsuka, M. Hatanaka, T. Onoye, H. Hatamoto, S. Ibi, S. Miyamoto, and S. Sampei, "Implementation of Ofdm Baseband Transceiver with Dynamic Spectrum Access for Cognitive Radio Systems," In Proc. of 9th International Symposium on Communication and Information Technology (ISCIT2009), pages 658-663, September 2009.

[80] S. Ninomiya and M. Hashimoto, "Enhancement of Grid-Based Spatially-Correlated Variability Modeling for Improving Ssta Accuracy," In Proceedings of IEEE International SOC Conference (SOCC), pages 337--340, September 2009.

[81] K. Hamamoto, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Tuning-Friendly Body Bias Clustering for Compensating Random Variability in Subthreshold Circuits," In Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pages 51--56, August 2009.

[82] D. Alnajjar, Y. Ko, T. Imagawa, H. Konoura, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, "Coarse-Grained Dynamically Reconfigurable Architecture with Flexible Reliability," In Proceedings of International Conference on Field Programmable Logic and Applications (FPL), pages 186--192, August 2009.

[83] S. Watanabe, M. Hashimoto, and T. Sato, "A Case for Exploiting Complex Arithmetic Circuits Towards Performance Yield Enhancement," In Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 401--407, March 2009.

[84] Y. Ko, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Coarse-Grained Dynamically Reconfigurable Architecture with Flexible Reliability," In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pages 236--241, March 2009.

[85] D. Alnajjar, Y. Ko, T. Imagawa, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, "A Coarse-Grained Dynamically Reconfigurable Architecture Enabling Flexible Reliability," In Proceedings of IEEE Workshop on System Effects of Logic Soft Errors (SELSE), March 2009.

[86] K. Shinkai and M. Hashimoto, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 79-84, February 2009. [2.pdf]

[87] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Trade-Off Analysis between Timing Error Rate and Power Dissipation for Adaptive Speed Control with Timing Error Prediction," In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC), pages 266-271, January 2009.

[88] L. Zhang, Y. Zhang, A. Tsuchiya, M. Hashimoto, E. Kuh, and C-K Cheng, "High Performance On-Chip Differential Signaling Using Passive Compensation for Global Communication," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 385--390, January 2009.

[89] T. Enami, M. Hashimoto, and T. Sato, "Decoupling Capacitance Allocation for Timing with Statistical Noise Model and Timing Analysis," In Proc. IEEE/ACM International Conference on Computer-Aided Design, pages 420-425, November 2008.

[90] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits," In ICCAD Colocated Workshop on Test Structure Design for Variability Characterization, November 2008.

[91] Y. Ogasahara, M. Hashimoto, T. Kanamoto, and T. Onoye, "Measurement of Supply Noise Suppression by Substrate and Deep N-Well in 90nm Process," In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 397--400, November 2008.

[92] Y. Zhang, L. Zhang, A. Tsuchiya, M. Hashimoto, and C.-K. Cheng, "On-Chip High Performance Signaling Using Passive Compensation," In Proceedings of IEEE International Conference on Computer Design (ICCD), pages 182-187, October 2008.

[93] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits," In Proc. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pages 3-8, August 2008.

[94] S. Watanabe, M. Hashimoto, and T. Sato, "Cascading Dependent Operations for Mitigating Timing Variability," In Proceedings. of Workshop on Quality-Aware Design (W-QUAD), June 2008.

[95] S. Takahashi, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, "A Design Method of Finding Optimal Sampling Pulse and Transistor Size in a Sampling Circuit for Liquid Crystal Displays," In In Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC), June 2008.

[96] K. Hamamoto, H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Experimental Study on Body-Biasing Layout Style - Negligible Area Overhead Enables Sufficient Speed Controllability -," In ACM Great Lakes Symposium on VLSI, pages 387-390, May 2008.

[97] T. Enami, S. Ninomiya, and M. Hashimoto, "Statistical Timing Analysis Considering Spatially and Temporally Correlated Dynamic Power Supply Noise," In Proc. ACM International Symposium on Physical Design, pages 160-167, April 2008. [1.txt]

[98] S. Abe, M. Hashimoto, and T. Onoye, "Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution," In Proc. International Symposium on Quality Electronic Design (ISQED), pages 520-525, March 2008.

[99] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site Soc Power Integrity Verification," In Proc. IEEE/ACM Asia and South Pacific Design Automation Conference, pages 107-108, January 2008.

[100] L. Zhang, J. Liu, H. Zhu, C-K Cheng, and M. Hashimoto, "High Performance Current-Mode Differential Logic," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 720--725, January 2008.

[101] K.Hamamoto, H.Fuketa, M.Hashimoto, Y.Mitsuyama, and T.Onoye, "A Study on Body-Biasing Layout Style Focusing on Area Efficiency and Speed Controllability," In Proc. Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI 2007), pages 233-237, October 2007.

[102] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Dynamic Supply Noise Measurement with All Digital Gated Oscillator for Evaluating Decoupling Capacitance Effect," In Proc. IEEE Custom Integrated Circuits Conference, pages 783-786, September 2007.

[103] T. Kanamoto, Y. Ogasahara, K. Natsume, K. Yamaguchi, H. Amishiro, T. Watanabe, and M. Hashimoto, "Impact of Well Edge Proximity Effect on Timing," In Proc. IEEE European Solid-State Device Research Conference, pages 115-118, September 2007.

[104] M. Hashimoto, J. Siriporn, A. Tsuchiya, H. Zhu, and C.-K. Cheng, "Analytical Eye-Diagram Model for On-Chip Distortionless Transmission Lines and Its Application to Design Space Exploration," In Proc. IEEE Custom Integrated Circuits Conference, pages 869-872, September 2007.

[105] K. Shinkai, M. Hashimoto, and T. Onoye, "Future Prediction of Self-Heating in Short Intra-Block Wires," In Proc. International Symposium on Quality Electronic Design (ISQED), pages 660-665, March 2007.

[106] K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proc. International Conference on Computer-Aided Design (ICCAD), pages 47-53, November 2006.

[107] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Discussion on Wire Cross-Sectional Area Toward Inductive Crosstalk Free Interconnects," Proc. IEEE International Conference on Computer Design, pages 70--75, October 2006.

[108] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement of Inductive Coupling Effect on Timing in 90nm Global Interconnects," In Proc. IEEE Custom Integrated Circuits Conference, pages 721--724, September 2006.

[109] Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, "Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation," In Proc.~IEEE Custom Integrated Circuits Conference, pages 861--864, September 2006.

[110] T. Ijichi, M. Hashimoto, S. Takahashi, S. Tsukiyama, and I. Shirakawa, "Transistor Sizing of Lcd Driver Circuit for Technology Migration," In Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC), volume 1, I25--I28, July 2006.

[111] T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, "Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design," In Proceedings of IEEE Wrokshop on Signal Propagation on Interconnects (SPI), pages 227--230, May 2006.

[112] K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 59-64, February 2006.

[113] T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, "Effective Si-Substrate Modeling for Frequency-Dependent Interconnect Resistance and Inductance Extraction," In The 3rd International Workshop on Compact Modeling, pages 51--56, January 2006.

[114] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Interconnect Rl Extraction at a Single Representative Frequency," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 515-520, January 2006.

[115] S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, "A Sampling Switch Design for Liquid Crystal Displays," In Proceedings of IEEE International Region 10 Conference, 1C-03.3, 2005.

[116] S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, "A Design Scheme for Sampling Switch in Active Matrix LCD," In Proceedings of European Conference on Circuit Theory and Design, 3e-212, 2005.

[117] S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, "A Sampling Switch Design for Liquid Crystal Displays," In Proceedings of IEEE International Region 10 Conference, November 2005.

[118] T. Kouno, M. Hashimoto, and H. Onodera, "Input Capacitance Modeling of Logic Gates for Accurate Static Timing Analysis," In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 453-456, November 2005.

[119] M. Hashimoto, A. Tsuchiya, A. Shinmyo, and H. Onodera, "Performance Prediction of On-Chip High-Throughput Global Signaling," In Proceedings of IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging (EPEP), pages 79-82, October 2005.

[120] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Delay Variation Due to Inductive Coupling," In Proc. IEEE Custom Integrated Circuits Conference, pages 305--308, September 2005.

[121] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Design Guideline for Resistive Termination of On-Chip High-Speed Interconnects," In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), pages 613-616, September 2005.

[122] S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, "A Design Scheme for Sampling Switch in Active Matrix Lcd," In A Design Scheme for Sampling Switch in Active Matrix LCD, August 2005.

[123] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Substrate Loss of On-Chip Transmission-Lines with Power/Ground Wires in Lower Layer," In Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), May 2005.

[124] Y. Uchida, S. Tani, M. Hashimoto, S. Tsukiyama, and I. Shirakawa, "Interconnect Capacitance Extraction for System LCD Circuits," In in Proc. IEEE/ACM Great Lake Symposium on Very Large Scale Integrated circuits (GLSVLSI 2005), pages 160--163, April 2005.

[125] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Effects of Orthogonal Power/Ground Wires on On-Chip Interconnect Characteristics," In Proceedings of International Meeting for Future of Electron Devices, Kansai, pages 33-34, April 2005.

[126] A. Muramatsu, M. Hashimoto, and H. Onodera, "Effects of On-Chip Inductance on Power Distribution Grid," In Proceedings of International Symposium on Physical Design (ISPD), pages 63-69, April 2005.

[127] M. Hashimoto, T. Yamamoto, and H. Onodera, "Statistical Analysis of Clock Skew Variation in H-Tree Structure," In Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 402-407, March 2005.

[128] T. Sato, M. Hashimoto, and H. Onodera, "Successive Pad Assignment Algorithm to Optimize Number and Location of Power Supply Pad Using Incremental Matrix Inversion," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 723-728, January 2005.

[129] M. Hashimoto, J. Yamaguchi, T. Sato, and H. Onodera, "Timing Analysis Considering Temporal Supply Voltage Fluctuation," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 1098-1101, January 2005.

[130] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Return Path Selection for Loop Rl Extraction," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 1078-1081, January 2005.

[131] T. Sato, N. Ono, J. Ichimiya, K. Hachiya, and M. Hashimoto, "On-Chip Thermal Gradient Analysis and Temperature Flattening for Soc Design," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 1074-1077, January 2005.

[132] A. Shinmyo, M. Hashimoto, and H. Onodera, "Design and Measurement of 6.4 Gbps 8:1 Multiplexer in 0.18um Cmos Process," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), D9-D10, January 2005.

[133] M. Hashimoto, A. Tsuchiya, A. Shinmyo, and H. Onodera, "Performance Prediction of On-Chip Global Signaling," In IEEE Electrical Design of Advanced Packaging and Systems (EDAPS) , pages 87-100, November 2004.

[134] M. Hashimoto, J. Yamaguchi, and H. Onodera, "Timing Analysis Considering Spatial Power/Ground Level Variation," In Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), pages 814-820, November 2004.

[135] M. Hashimoto, A. Tsuchiya, and H. Onodera, "On-Chip Global Signaling by Wave Pipelining," In IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging (EPEP), pages 311-314, October 2004.

[136] A. Muramatsu, M. Hashimoto, and H. Onodera, "Lsi Power Network Analysis with On-Chip Wire Inductance," In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pages 55-60, October 2004.

[137] T. Sato, M. Hashimoto, and H. Onodera, "An Ir-Drop Minimization by Optimizing Number and Location of Power Supply Pads," In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pages 66-72, October 2004.

[138] M. Hashimoto, T. Yamamoto, and H. Onodera, "Statistical Analysis of Clock Skew Variation," In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pages 214-219, October 2004.

[139] T. Miyazaki, M. Hashimoto, and H. Onodera, "A Performance Prediction of Clock Generation Plls: a Ring Oscillator Based Pll and an Lc Oscillator Based Pll," In IEEJ International Analog VLSI Workshop, pages 45-50, October 2004.

[140] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Performance Limitation of On-Chip Global Interconnects for High-Speed Signaling," In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), pages 489-492, September 2004.

[141] A. Shinmyo, M. Hashimoto, and H. Onodera, "Design and Optimization of Cmos Current Mode Logic Dividers," In IEEE Asia-Pacific Conference on Advanced System Integrated Circuits , pages 434-435, August 2004.

研究会等発表論文

[1] S. Iizuka, Y. Higuchi, M. Hashimoto, and T. Onoye, "Area Efficient Device-Parameter Estimation Using Sensitivity-Configurable Ring Oscillator," 電子情報通信学会 VLSI設計技術研究会, March 2015.

[2] 亀田敏広, 郡浦宏明, 密山幸男, 橋本昌宜, 尾上孝雄, "スキャンパスを用いたＮＢＴＩ劣化抑制に関する研究," 情報処理学会DAシンポジウム, pages 201-206, 2011年8月.

[3] 郡浦宏明, 密山幸男, 橋本昌宜, 尾上孝雄, "NBTI による劣化予測におけるトランジスタ動作確率算出法の評価," 情報処理学会DAシンポジウム, pages 181-186, 2009年8月.

[4] 橋本昌宜, "製造・環境ばらつきを考慮したタイミング検証技術," 信学技報, VLD2007-65, pages 21-24, 2007年10月.

[5] 橋本昌宜, "製造・環境ばらつきと動的性能補償を考慮したタイミング検証に向けて," 第20回 回路とシステム(軽井沢)ワークショップ, pages 661-666, 2007年4月.

著書

[1] M. Hashimoto and R. Nair, "Power Integrity for Nanoscale Integrated Systems," McGraw-Hill Professional, February 2014.