論文誌

[1] T.T. Oo, T. Onoye, and K. Shin, "Partial Encryption Method That Enhances MP3 Security," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, volume E98-A, number 8, pages 1760-1768, August 2015. [2.pdf]

[2] K. Shinkai, M. Hashimoto, and T. Onoye, "A Gate-Delay Model Focusing on Current Fluctuation Over Wide Range of Process-Voltage-Temperature Variations," Integration, the VLSI Journal, volume 46, number 4, pages 345--358, September 2013.

[3] K. Shinkai, M. Hashimoto, and T. Onoye, "Extracting Device-Parameter Variations with Ro-Based Sensors," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E94-A, number 12, pages 2537--2544, December 2011.

[4] T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, "Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, volume 93-A, number 12, pages 2399-2408, December 2010.

[5] K. Shinkai, M. Hashimoto, and T. Onoye, "Prediction of Self-Heating in Short Intra-Block Wires," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 3, pages 583-594, March 2010. [2.pdf]

国際会議

[1] Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, "Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator," Proceedings of IEEE European Test Symposium (ETS), pages 106--111, May 2013.

[2] K. Shinkai, M. Hashimoto, and T. Onoye, "Extracting Device-Parameter Variations with Ro-Based Sensors," In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 13--18, March 2011.

[3] K. Shinkai and M. Hashimoto, "Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability," In Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC), pages 683-688, January 2011. [2.pdf]

[4] K. Shinkai and M. Hashimoto, "Self-Heating in Nano-Scale Vlsi Interconnects," In Proceedings of International Workshop on Information Communication Technology (ICT), S-1-6, August 2010. [2.pdf]

[5] S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, "Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors," In Proc. Great Lakes Symposium on VLSI (GLSVLSI), May 2010.

[6] T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, "Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 41-46, March 2010.

[7] S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, "Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2010.

[8] K. Shinkai and M. Hashimoto, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 79-84, February 2009. [2.pdf]

[9] K. Shinkai, M. Hashimoto, and T. Onoye, "Future Prediction of Self-Heating in Short Intra-Block Wires," In Proc. International Symposium on Quality Electronic Design (ISQED), pages 660-665, March 2007.

[10] K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proc. International Conference on Computer-Aided Design (ICCAD), pages 47-53, November 2006.

[11] K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 59-64, February 2006.