- 国際会議
- [1] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced Seu and Mcu Rate Characterization and Analysis of Sotb and Bulk Srams at 0.3v Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.